Ryuka IP Law Firm Home 事务所介绍 Foreign


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Foreign

所长 龙华 明裕 Aki Ryuka
 Detail

Qualifications:
专利代理人(日本)
注册可代理在日本的知识产权诉讼
美国律师(加利福尼亚州)

擅长领域:
申请等业务、实施许可、诉讼、鉴定、日本专利领域的海关调查、外观设计、商标法

学历:
1987年,东京大学 工程科硕士
1984年,东北大学 工程科学士


合伙人 Adam Langley
 Detail

Qualifications:
美国专利律师
Admitted to the Virginia State Bar (2009)
Admitted to Practice before the U.S. Patent and Trademark Office (2008)

学历:
Juris Doctor, George Mason University School of Law (2007)
Bachelor of Science, Mechanical Engineering, University of Missouri (2003)


Of Counsel William Bollman

Qualifications:
美国专利律师
Admitted to the Washington DC Bar
Admitted to the Maryland State Bar
Admitted to Practice before the U.S. Patent and Trademark Office

学历:
B.S (Electrical Engineering), University of Delaware
M.E (Electrical Engineering), Clemson University
J.D., George Washington University


MA Lin
 Detail

Qualifications:
中国律师

擅长领域:
Counterfeit countermeasure provision, IP infringement and dispute resolution, Patent prosecution

学历:
Master Degree of Civil Law in Intellectual Property, KEIO University (Tokyo), 2015
Dual-Bachelor Degrees in Law and English, Beijing Science and Technology University, 2005


Tracey Cui
 Detail

Qualifications:
U.S. Uniform Bar Examination

学历:
Bachelor of Arts, Political Theory and East Asian Studies, McGill University
Juris Doctor, Fordham University School of Law



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