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Attorneys

President Aki Ryuka
 Detail

Qualifications:
Patent Attorney (Japan)
Certified to practice IP litigation in Japan
Attorney at Law, California, USA

Practice Areas:
Prosecution, Licensing, Litigation, Opinions, and Customs Surveillance in the fields of Japanese Patent, Design, and Trademark law

Degrees:
Master of Engineering, Tokyo University, 1987
Bachelor of Engineering, Tohoku University, 1984


Junior Partner Adam Langley
 Detail

Qualifications:
U.S. Patent Attorney
Admitted to the Virginia State Bar (2009)
Admitted to Practice before the U.S. Patent and Trademark Office (2008)

Degrees:
Juris Doctor, George Mason University School of Law (2007)
Bachelor of Science, Mechanical Engineering, University of Missouri (2003)


Of Counsel William Bollman

Qualifications:
U.S. Patent Attorney
Admitted to the Washington DC Bar
Admitted to the Maryland State Bar
Admitted to Practice before the U.S. Patent and Trademark Office

Degrees:
B.S (Electrical Engineering), University of Delaware
M.E (Electrical Engineering), Clemson University
J.D., George Washington University


MA Lin
 Detail

Qualifications:
Lawyer (Mainland of China)

Practice Areas:
Counterfeit countermeasure provision, IP infringement and dispute resolution, Patent prosecution

Degrees:
Master Degree of Civil Law in Intellectual Property, KEIO University (Tokyo), 2015
Dual-Bachelor Degrees in Law and English, Beijing Science and Technology University, 2005


Tracey Cui
 Detail

Qualifications:
U.S. Uniform Bar Examination

Degrees:
Bachelor of Arts, Political Theory and East Asian Studies, McGill University
Juris Doctor, Fordham University School of Law


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